Firm index
Chinese toolmakers to watch
Product claims are easy to find. The harder question is whether firms are building the staff and support functions needed for production use.
Section 1
Full dossiers
These firms have enough current source coverage for a fuller product and workforce-read page.
Shanghai
AMEC
中微公司
AMEC is the clearest listed-company anchor for China's etch story, with added deposition product coverage.
- Etch, clean, and strip
- Deposition
4 product-record entries · 2 public sources
Open dossier->Beijing
NAURA Technology Group
北方华创
NAURA is the scale case: a broad equipment group with public signals across deposition, etch/clean, furnaces, wet tools, implant, RTP, and epi.
- Deposition
- Etch, clean, and strip
3 product-record entries · 2 public sources
Open dossier->Shanghai
ACM Research Shanghai
盛美上海
ACM Research Shanghai gives the clearest public view of the wet-clean, strip, and service layer among the firms in this dossier set.
- Etch, clean, and strip
- Deposition
3 product-record entries · 2 public sources
Open dossier->Shenyang
Piotech
拓荆科技
Piotech is the dedicated deposition firm in this dossier set, with source records covering multiple CVD and ALD product families.
- Deposition
2 product-record entries · 2 public sources
Open dossier->Section 2
Lighter watch cards
These firms belong in the monitor, but their current records need cautious handling before the site makes stronger claims.
Wuhan
Jingce Electronics
精测电子
Jingce is the Wuhan-based metrology and inspection entry; this dossier sits at watch-card depth until the full annual filing is reviewed.
- Metrology and inspection
6 product-record entries · 1 public source
Open watch card->Shanghai
Shanghai Micro Electronics Equipment
上海微电子装备
SMEE anchors the lithography-adjacent sidebar in this brief as a domestic source of optical, alignment, stage, and calibration talent.
- Lithography sidebar
- Metrology and inspection
2 product-record entries · 1 public source
Open watch card->Beijing
Beijing Electronics Inspection and Metrology Equipment
北京电子量检测装备有限责任公司
BEIM anchors the Beijing metrology and inspection presence in this dossier set, with a public profile that names front-end inspection categories without separating them from broader measurement work.
- Metrology and inspection
1 product-record entry · 1 public source
Open watch card->The index separates fuller dossiers from lighter watch cards based on current public-source coverage. Use it to compare disclosure depth, not to rank firms or measure technical performance.